著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Building highly transferable interatomic models for atomistic simulation of device reliability,SGEM Conference Proceedings,,,2017,III-6,,19-26,https://cir.nii.ac.jp/crid/1010282256897133570,