Building highly transferable interatomic models for atomistic simulation of device reliability
書誌事項
- タイトル
- Building highly transferable interatomic models for atomistic simulation of device reliability
- 著者
- Yoshitaka Umeno and Atsushi Kubo
収録刊行物
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- SGEM Conference Proceedings
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SGEM Conference Proceedings III-6 19-26, 2017
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詳細情報
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- CRID
- 1010282256897133570
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- 資料種別
- journal article
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- データソース種別
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- KAKEN