著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Measurement of Thin Film Elasticity Using Nanoscopic Contact Resonance of a Flat Tip in Sensitivity-Enhanced Atomic Force Acoustic Microscopy,Proc. 2nd JSME/ASME International Conference on Materials and Processing(CD-ROM),,,2005,,,1-5,https://cir.nii.ac.jp/crid/1010282256906928263,