[Updated on Apr. 18] Integration of CiNii Articles into CiNii Research

A Study of the Reliability of MOSFETs in Two Stacked Thin Chips for 3D System in Package

Bibliographic Information

Title
A Study of the Reliability of MOSFETs in Two Stacked Thin Chips for 3D System in Package
Author
Akihiro Ikeda, et al.

Journal

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Details

  • CRID
    1010282256927621509
  • Article Type
    journal article
  • Data Source
    • KAKEN

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