Surface Depth Analysis for Fluorinated Block Copolymer Films by X-ray Photoelectron Snectrosconv Using C_60Cluster Ion Beam
Bibliographic Information
- Title
- Surface Depth Analysis for Fluorinated Block Copolymer Films by X-ray Photoelectron Snectrosconv Using C_60Cluster Ion Beam
- Author
- K.Tanaka, 他5名
Journal
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- Appi. Surface Sci 254(17)
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Appi. Surface Sci 254(17) 5435-5438, 2008
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Details
-
- CRID
- 1010282256984081024
-
- Article Type
- journal article
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- Data Source
-
- KAKEN
