著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Surface Depth Analysis for Fluorinated Block Copolymer Films by X-ray Photoelectron Snectrosconv Using C_60Cluster Ion Beam,Appi. Surface Sci 254(17),,,2008,,,5435-5438,https://cir.nii.ac.jp/crid/1010282256984081024,