著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint,IEICE Transactions on Information and Systems E93-D,,,2009,,,24-32,https://cir.nii.ac.jp/crid/1010282257008276357,