Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
書誌事項
- タイトル
- Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
- 著者
- S.D.Findlay, N.Shibata, H.Sawada, E.Okunishi, Y.Kondo, Y.Ikuhara
収録刊行物
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- Appl.Phys.Lett. 95
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Appl.Phys.Lett. 95 191913-, 2009