Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
Bibliographic Information
- Title
- Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
- Author
- S.D.Findlay, N.Shibata, H.Sawada, E.Okunishi, Y.Kondo, Y.Ikuhara
Journal
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- Appl.Phys.Lett. 95
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Appl.Phys.Lett. 95 191913-, 2009
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Details
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- CRID
- 1010282257030770818
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- Article Type
- journal article
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- Data Source
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- KAKEN