著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Atomic-resolution STEM imaging of materials using a segmented annular all field detector,Microsc.Microanal.,,,2010,16(Suppl 2),,124-125,https://cir.nii.ac.jp/crid/1010282257030770945,