著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization,Nucl. Instr. and Meth. in Phys. Res. B,,,,,,,https://cir.nii.ac.jp/crid/1010282257065369088,