Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization
書誌事項
- タイトル
- Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization
- 著者
- K. Hirata, Y. Saitoh, A. Chiba, K. Yamada,and K. Narumi
収録刊行物
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- Nucl. Instr. and Meth. in Phys. Res. B
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Nucl. Instr. and Meth. in Phys. Res. B