著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,"Variations in contrast of scanning electron microscope images for microstructure analysis of Si-based semiconductor materials, Masaru Itakura","Kaoru Sato and Shigeaki Tachibana, J. Electron Microscopy",,,2010,59,,165-173,https://cir.nii.ac.jp/crid/1010282257065869058,