著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structure,Journal of Physics:Condensed Matter,,,2010,22,,474006,https://cir.nii.ac.jp/crid/1010282257066221575,