First-principles study on electronic structures and dielectric properties of Si/SiO_2 interface, Journal of Physics
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- ONO Tomoya
- 大阪大学
Bibliographic Information
- Title
- First-principles study on electronic structures and dielectric properties of Si/SiO_2 interface, Journal of Physics
- Author
- Tomoya Ono, Katsuhiro Kutsuki, Yoshiyuki Egami, Heiji Watanabe, and Kikuji Hirose
Journal
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- Condensed Matter 19(36)
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Condensed Matter 19(36) 3652021-7, 2007
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Details
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- CRID
- 1010282257407381763
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- Article Type
- journal article
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- Data Source
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- KAKEN