著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Ge/GeO2 Interface Control with High Pressure Oxidation for Improving Electrical Characteristics,ECS Trans. 19(1),,,2009,,,165-173,https://cir.nii.ac.jp/crid/1010282257416065797,