Study on the Frequency Dependence of Lateral Energy Leakage in RF BAW Device by Fast-Scanning Laser Probe System
書誌事項
- タイトル
- Study on the Frequency Dependence of Lateral Energy Leakage in RF BAW Device by Fast-Scanning Laser Probe System
- 著者
- N.Wu, K.Hashimoto, K.Kashiwa, T.Omori, M.Yamaguchi
収録刊行物
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- Japanese Journal of Applied Physics 48
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Japanese Journal of Applied Physics 48 2009