{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1040566775626711552.json","@type":"Project","projectIdentifier":[{"@type":"KAKEN","@value":"19H05664"},{"@type":"JGN","@value":"JP19H05664"},{"@type":"URI","@value":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-19H05664/"}],"jpcoar:awardTitle":[{"@language":"ja","@value":"ミューオン起因ソフトエラー評価基盤技術: 実測とシミュレーションに基づく将来予測"},{"@language":"en","@value":"Muon-induced soft error evaluation platform: future prediction based on measurement and simulation"}],"field":[{"keyword":[{"language":"ja","textList":["大区分J"]},{"language":"en","textList":["Broad Section J"]}]}],"dc:language":"ja","description":[{"type":"outline_of_research_initial","notation":[{"@language":"ja","@value":"地上に降り注ぐ二次宇宙線粒子によって生じる一過性の誤動作 (ソフトエラー)が集積システムの信頼性を決める最大要因となっている。デバイスの微細化により、ミューオンが中性子に変わってソフトエラーの主要因となるパラダイムシフトが起こり、急速にエラー率が増加する可能性がある。本研究では、集積システムの信頼性確保に向けて、ミューオン起因のソフトエラーを正しく理解・評価する技術を世界に先駆けて確立し、将来デバイスの信頼性動向を明らかにする。基礎物理現象の把握と実測結果の再現性検証によりシミュレーション技術の精度を格段に高め、将来の集積システムの信頼性確保に貢献する。"}]}],"researcher":[{"@id":"https://cir.nii.ac.jp/crid/1420001326224847232","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"80335207"},{"@type":"NRID","@value":"1000080335207"},{"@type":"ORCID","@value":"0000-0002-0377-2108"},{"@type":"NRID","@value":"9000004827162"},{"@type":"NRID","@value":"9000024235660"},{"@type":"NRID","@value":"9000258390605"},{"@type":"NRID","@value":"9000272999805"},{"@type":"NRID","@value":"9000399577311"},{"@type":"NRID","@value":"9000238422732"},{"@type":"NRID","@value":"9000258734432"},{"@type":"NRID","@value":"9000005818170"},{"@type":"NRID","@value":"9000004826457"},{"@type":"NRID","@value":"9000004842789"},{"@type":"NRID","@value":"9000006588005"},{"@type":"NRID","@value":"9000309984498"},{"@type":"NRID","@value":"9000386229128"},{"@type":"NRID","@value":"9000392752082"},{"@type":"NRID","@value":"9000410903905"},{"@type":"NRID","@value":"9000388462114"},{"@type":"NRID","@value":"9000017688991"},{"@type":"NRID","@value":"9000005818393"},{"@type":"NRID","@value":"9000240076587"},{"@type":"NRID","@value":"9000398137779"},{"@type":"NRID","@value":"9000332222860"},{"@type":"NRID","@value":"9000399575692"},{"@type":"NRID","@value":"9000333080372"},{"@type":"NRID","@value":"9000017688997"},{"@type":"NRID","@value":"9000243852006"},{"@type":"NRID","@value":"9000238476421"},{"@type":"NRID","@value":"9000311503473"},{"@type":"NRID","@value":"9000017138284"},{"@type":"NRID","@value":"9000380484761"},{"@type":"NRID","@value":"9000356549345"},{"@type":"NRID","@value":"9000258734415"},{"@type":"NRID","@value":"9000004795586"},{"@type":"NRID","@value":"9000001620092"},{"@type":"NRID","@value":"9000403554726"},{"@type":"NRID","@value":"9000380487295"},{"@type":"NRID","@value":"9000404292664"},{"@type":"NRID","@value":"9000404307854"},{"@type":"NRID","@value":"9000403156769"},{"@type":"NRID","@value":"9000403156779"},{"@type":"NRID","@value":"9000399576118"},{"@type":"NRID","@value":"9000404292659"},{"@type":"NRID","@value":"9000240053528"},{"@type":"NRID","@value":"9000362766912"},{"@type":"NRID","@value":"9000291613208"},{"@type":"NRID","@value":"9000107315486"},{"@type":"NRID","@value":"9000004793003"},{"@type":"NRID","@value":"9000004827373"},{"@type":"NRID","@value":"9000404307913"},{"@type":"NRID","@value":"9000404307942"},{"@type":"NRID","@value":"9000380484296"},{"@type":"NRID","@value":"9000380487498"},{"@type":"NRID","@value":"9000016259938"},{"@type":"NRID","@value":"9000287200163"},{"@type":"NRID","@value":"9000402240450"},{"@type":"NRID","@value":"9000272999742"},{"@type":"NRID","@value":"9000258118766"},{"@type":"NRID","@value":"9000259338796"},{"@type":"NRID","@value":"9000046174713"},{"@type":"NRID","@value":"9000404300560"},{"@type":"NRID","@value":"9000287200267"},{"@type":"NRID","@value":"9000258118770"},{"@type":"NRID","@value":"9000291612703"},{"@type":"NRID","@value":"9000259338725"},{"@type":"NRID","@value":"9000017194233"},{"@type":"NRID","@value":"9000404300638"},{"@type":"NRID","@value":"9000258118761"},{"@type":"NRID","@value":"9000332221801"},{"@type":"NRID","@value":"9000403024411"},{"@type":"NRID","@value":"9000399577047"},{"@type":"NRID","@value":"9000006288230"},{"@type":"NRID","@value":"9000019096901"},{"@type":"NRID","@value":"9000382670175"},{"@type":"NRID","@value":"9000404221362"},{"@type":"NRID","@value":"9000258734402"},{"@type":"NRID","@value":"9000004828935"},{"@type":"NRID","@value":"9000243852004"},{"@type":"NRID","@value":"9000404300699"},{"@type":"NRID","@value":"9000404086225"},{"@type":"NRID","@value":"9000010490832"},{"@type":"NRID","@value":"9000018320787"},{"@type":"NRID","@value":"9000404300656"},{"@type":"NRID","@value":"9000380486583"},{"@type":"NRID","@value":"9000380486429"},{"@type":"NRID","@value":"9000388462325"},{"@type":"NRID","@value":"9000017688987"},{"@type":"NRID","@value":"9000003631995"},{"@type":"NRID","@value":"9000004797528"},{"@type":"NRID","@value":"9000270897124"},{"@type":"NRID","@value":"9000369348243"},{"@type":"NRID","@value":"9000256345799"},{"@type":"NRID","@value":"9000410925389"},{"@type":"NRID","@value":"9000240053460"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/masanorihashimoto"}],"foaf:name":[{"@language":"ja","@value":"橋本 昌宜"},{"@language":"en","@value":"Hashimoto Masanori"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"京都大学"}],"role":"principal_investigator"},{"@id":"https://cir.nii.ac.jp/crid/1420564276181060352","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"00727373"},{"@type":"NRID","@value":"1000000727373"},{"@type":"ORCID","@value":"0000-0002-5935-5450"}],"foaf:name":[{"@language":"ja","@value":"安部 晋一郎"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"国立研究開発法人日本原子力研究開発機構"}],"role":"co_investigator_buntan"},{"@id":"https://cir.nii.ac.jp/crid/1420564276171160448","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"10817133"},{"@type":"NRID","@value":"1000010817133"},{"@type":"NRID","@value":"9000402476073"},{"@type":"NRID","@value":"9000241157864"},{"@type":"NRID","@value":"9000243733679"},{"@type":"NRID","@value":"9000376938327"},{"@type":"NRID","@value":"9000018725313"},{"@type":"NRID","@value":"9000376937129"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/shkawase"}],"foaf:name":[{"@language":"ja","@value":"川瀬 頌一郎"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"九州大学"}],"role":"co_investigator_buntan"},{"@id":"https://cir.nii.ac.jp/crid/1420564276172510976","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"30210959"},{"@type":"NRID","@value":"1000030210959"},{"@type":"ORCID","@value":"0000-0003-0187-5880"},{"@type":"NRID","@value":"9000003205236"},{"@type":"NRID","@value":"9000283896630"},{"@type":"NRID","@value":"9000392096964"},{"@type":"NRID","@value":"9000009324151"},{"@type":"NRID","@value":"9000392092123"},{"@type":"NRID","@value":"9000322735717"},{"@type":"NRID","@value":"9000401867161"},{"@type":"NRID","@value":"9000392092168"},{"@type":"NRID","@value":"9000399257875"},{"@type":"NRID","@value":"9000018975253"},{"@type":"NRID","@value":"9000250746931"},{"@type":"NRID","@value":"9000283896625"},{"@type":"NRID","@value":"9000392118224"},{"@type":"NRID","@value":"9000254590621"},{"@type":"NRID","@value":"9000392112896"},{"@type":"NRID","@value":"9000392103787"},{"@type":"NRID","@value":"9000250746908"},{"@type":"NRID","@value":"9000254155618"},{"@type":"NRID","@value":"9000388509963"},{"@type":"NRID","@value":"9000248960024"},{"@type":"NRID","@value":"9000254139695"},{"@type":"NRID","@value":"9000283896633"},{"@type":"NRID","@value":"9000410924619"},{"@type":"NRID","@value":"9000392063549"},{"@type":"NRID","@value":"9000283304267"},{"@type":"NRID","@value":"9000283304282"},{"@type":"NRID","@value":"9000260207650"},{"@type":"NRID","@value":"9000322736128"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/yukinobu_watanabe"}],"foaf:name":[{"@language":"ja","@value":"渡辺 幸信"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"九州大学"}],"role":"co_investigator_buntan"},{"@id":"https://cir.nii.ac.jp/crid/1420845751150571648","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"40362610"},{"@type":"NRID","@value":"1000040362610"},{"@type":"NRID","@value":"9000015193934"},{"@type":"NRID","@value":"9000007843604"},{"@type":"NRID","@value":"9000336381317"},{"@type":"NRID","@value":"9000331895064"},{"@type":"NRID","@value":"9000350619325"},{"@type":"NRID","@value":"9000059924772"},{"@type":"NRID","@value":"9000017761585"},{"@type":"NRID","@value":"9000415065249"},{"@type":"NRID","@value":"9000241156727"},{"@type":"NRID","@value":"9000404800483"},{"@type":"NRID","@value":"9000312825994"},{"@type":"NRID","@value":"9000340451079"},{"@type":"NRID","@value":"9000402476901"},{"@type":"NRID","@value":"9000006640086"},{"@type":"NRID","@value":"9000350638094"},{"@type":"NRID","@value":"9000389948284"},{"@type":"NRID","@value":"9000261698551"},{"@type":"NRID","@value":"9000406035985"},{"@type":"NRID","@value":"9000411661127"},{"@type":"NRID","@value":"9000253310649"},{"@type":"NRID","@value":"9000412131302"},{"@type":"NRID","@value":"9000004954048"},{"@type":"NRID","@value":"9000412378393"},{"@type":"NRID","@value":"9000401965170"},{"@type":"NRID","@value":"9000006124420"},{"@type":"NRID","@value":"9000397948895"},{"@type":"NRID","@value":"9000237734931"},{"@type":"NRID","@value":"9000264253706"},{"@type":"NRID","@value":"9000003137248"},{"@type":"NRID","@value":"9000350636605"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/read0091174"}],"foaf:name":[{"@language":"ja","@value":"佐藤 朗"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"大阪大学"}],"role":"co_investigator_buntan"},{"@id":"https://cir.nii.ac.jp/crid/1420564276175415808","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"50644720"},{"@type":"NRID","@value":"1000050644720"},{"@type":"NRID","@value":"9000241157516"},{"@type":"NRID","@value":"9000243735001"},{"@type":"NRID","@value":"9000290378175"},{"@type":"NRID","@value":"9000402477568"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/niikura"}],"foaf:name":[{"@language":"ja","@value":"新倉 潤"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"国立研究開発法人理化学研究所"}],"role":"co_investigator_buntan"},{"@id":"https://cir.nii.ac.jp/crid/1420282801211462912","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"70294022"},{"@type":"NRID","@value":"1000070294022"},{"@type":"NRID","@value":"9000405641545"},{"@type":"NRID","@value":"9000401803687"},{"@type":"NRID","@value":"9000402004550"},{"@type":"NRID","@value":"9000403020166"}],"foaf:name":[{"@language":"ja","@value":"鎌倉 良成"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"大阪工業大学"}],"role":"co_investigator_buntan"}],"since":"2019-06-26","until":"2024-03-31","institution":[{"institutionIdentifier":[{"@type":"NII","@value":"0014301"}],"notation":[{"@language":"ja","@value":"京都大学"},{"@language":"en","@value":"Kyoto University"}]}],"fundingProgram":[{"jpcoar:funderName":[{"@language":"ja","@value":"科学研究費助成事業"},{"@language":"en","@value":"Grants-in-Aid for Scientific Research"}]},{"funderIdentifier":[{"@type":"CROSSREF","@value":"10.13039/501100001691"}],"jpcoar:funderName":[{"@language":"ja","@value":"科学研究費助成事業"}]},{"funderIdentifier":[{"@type":"CROSSREF","@value":"10.13039/501100001691"}],"jpcoar:funderName":[{"@language":"ja","@value":"科学研究費助成事業"}]},{"jpcoar:funderName":[{"@language":"ja","@value":"科学研究費助成事業"}]},{"jpcoar:funderName":[{"@language":"ja","@value":"科学研究費助成事業"}]},{"funderIdentifier":[{"@type":"CROSSREF","@value":"10.13039/501100001691"}],"jpcoar:funderName":[{"@language":"ja","@value":"科学研究費助成事業"}]}],"url":[{"@id":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-19H05664/","notation":[{"@value":"KAKEN"}]}],"createdAt":"2019-06-27","modifiedAt":"2026-01-26","foaf:topic":[{"@id":"https://cir.nii.ac.jp/all?q=%E3%82%BD%E3%83%95%E3%83%88%E3%82%A8%E3%83%A9%E3%83%BC","dc:title":"ソフトエラー"},{"@id":"https://cir.nii.ac.jp/all?q=%E3%83%9F%E3%83%A5%E3%83%BC%E3%82%AA%E3%83%B3","dc:title":"ミューオン"},{"@id":"https://cir.nii.ac.jp/all?q=%E9%9B%86%E7%A9%8D%E3%82%B7%E3%82%B9%E3%83%86%E3%83%A0","dc:title":"集積システム"},{"@id":"https://cir.nii.ac.jp/all?q=VLSI","dc:title":"VLSI"},{"@id":"https://cir.nii.ac.jp/all?q=%E4%BF%A1%E9%A0%BC%E6%80%A7","dc:title":"信頼性"}],"product":[{"@id":"https://cir.nii.ac.jp/crid/1050585803064848128","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"HDL","@value":"https://hdl.handle.net/2324/7172710"},{"@type":"DOI","@value":"10.1109/tns.2024.3378216"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/23/10504904/10474031.pdf?arnumber=10474031"}],"notation":[{"@language":"en","@value":"Impact of Irradiation Side on Muon-Induced Single-Event Upsets in 65-nm Bulk SRAMs"}]},{"@id":"https://cir.nii.ac.jp/crid/1360584341816669952","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.14407/jrpr.2023.00423"},{"@type":"URI","@value":"http://jrpr.org/upload/pdf/jrpr-2023-00423.pdf"},{"@type":"URI","@value":"http://jrpr.org/journal/view.php?doi=10.14407/jrpr.2023.00423"}],"notation":[{"@value":"Development of a Measuring Method of Cosmic-Ray Muon Momentum Distribution Using Drift Chambers"}]},{"@id":"https://cir.nii.ac.jp/crid/1050306495455783040","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"HDL","@value":"https://hdl.handle.net/2324/7174411"},{"@type":"DOI","@value":"10.1016/j.nima.2023.168984"},{"@type":"URI","@value":"https://api.elsevier.com/content/article/PII:S0168900223009841?httpAccept=text/xml"},{"@type":"URI","@value":"https://api.elsevier.com/content/article/PII:S0168900223009841?httpAccept=text/plain"}],"notation":[{"@language":"en","@value":"Effect of large-angle incidence on particle identification performance for light-charged (Z ≦ 2) particles by pulse shape analysis with a pad-type nTD silicon detector"},{"@value":"Effect of large-angle incidence on particle identification performance for light-charged (<mml:math xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" altimg=\"si2.svg\" display=\"inline\" id=\"d1e252\"><mml:mrow><mml:mi>Z</mml:mi><mml:mo linebreak=\"goodbreak\" linebreakstyle=\"after\">≤</mml:mo><mml:mn>2</mml:mn></mml:mrow></mml:math>) particles by pulse shape analysis with a pad-type nTD silicon detector"}]},{"@id":"https://cir.nii.ac.jp/crid/1050586035059224960","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"HDL","@value":"http://hdl.handle.net/2433/294650"},{"@type":"DOI","@value":"10.1109/tcsi.2023.3300899"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/8919/10268488/10220121.pdf?arnumber=10220121"}],"notation":[{"@language":"en","@value":"Reliability Exploration of System-on-Chip With Multi-Bit-Width Accelerator for Multi-Precision Deep Neural Networks"}]},{"@id":"https://cir.nii.ac.jp/crid/1010021218958113028","@type":"Article","resourceType":"学術雑誌論文(journal article)","notation":[{"@language":"ja","@value":"Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation"}]},{"@id":"https://cir.nii.ac.jp/crid/1390013795251200640","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1587/transfun.2022vlp0004"},{"@type":"URI","@value":"https://www.jstage.jst.go.jp/article/transfun/E106.A/3/E106.A_2022VLP0004/_pdf"}],"notation":[{"@language":"en","@value":"Vulnerability Estimation of DNN Model Parameters with Few Fault Injections"}]},{"@id":"https://cir.nii.ac.jp/crid/1360865815676631040","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/irps48203.2023.10118134"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/10117589/10117581/10118134.pdf?arnumber=10118134"}],"notation":[{"@value":"Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons"}]},{"@id":"https://cir.nii.ac.jp/crid/1360865815674665344","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1051/epjconf/202328401029"},{"@type":"URI","@value":"https://www.epj-conferences.org/10.1051/epjconf/202328401029/pdf"}],"notation":[{"@value":"Emissions of Hydrogen Isotopes from the Nuclear Muon Capture Reaction in <sup>nat</sup>Si"}]},{"@id":"https://cir.nii.ac.jp/crid/1010021218958113032","@type":"Article","resourceType":"学術雑誌論文(journal article)","notation":[{"@language":"ja","@value":"Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs"}]},{"@id":"https://cir.nii.ac.jp/crid/1010021218958113033","@type":"Article","resourceType":"学術雑誌論文(journal article)","notation":[{"@language":"ja","@value":"How Accurately Can Soft Error Impact Be Estimated in Black-Box/White-Box Cases? -- a Case Study with an Edge AI SoC --"}]},{"@id":"https://cir.nii.ac.jp/crid/1010021218958113034","@type":"Article","resourceType":"学術雑誌論文(journal article)","notation":[{"@language":"ja","@value":"Avoiding Soft Error-Induced Illegal Memory Accesses in GPU with Inter-Thread Communication"}]},{"@id":"https://cir.nii.ac.jp/crid/1010021218958113027","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI_AS_WRITTEN","@value":"10.11484/jaea-conf-2022-001"}],"notation":[{"@language":"ja","@value":"Development of a counter telescope for light charged particles emitted from muon capture reaction in Si"}]},{"@id":"https://cir.nii.ac.jp/crid/1360572092635844864","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/tns.2020.2976125"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/23/9142457/09007746.pdf?arnumber=9007746"}],"notation":[{"@value":"Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs"}]},{"@id":"https://cir.nii.ac.jp/crid/1360013168886079872","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/tns.2021.3131346"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/23/9686573/09628001.pdf?arnumber=9628001"}],"notation":[{"@value":"Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: From Bit Upset to SEFI and Erroneous Behavior"}]},{"@id":"https://cir.nii.ac.jp/crid/1360861295474000256","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.23919/date54114.2022.9774569"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/9774496/9774497/09774569.pdf?arnumber=9774569"}],"notation":[{"@value":"Estimating Vulnerability of All Model Parameters in DNN with a Small Number of Fault Injections"}]},{"@id":"https://cir.nii.ac.jp/crid/1360861705566896384","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/itc44778.2020.9325216"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/9325188/9325208/09325216.pdf?arnumber=9325216"}],"notation":[{"@value":"Concurrent Detection of Failures in GPU Control Logic for Reliable Parallel Computing"}]},{"@id":"https://cir.nii.ac.jp/crid/1360580232386216704","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/irps45951.2020.9128951"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/9125439/9128217/09128951.pdf?arnumber=9128951"}],"notation":[{"@value":"Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets"}]},{"@id":"https://cir.nii.ac.jp/crid/1360861705567163520","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/tns.2020.2978257"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/23/4689328/09024135.pdf?arnumber=9024135"}],"notation":[{"@value":"Measurement of Single-Event Upsets in 65-nm SRAMs Under Irradiation of Spallation Neutrons at J-PARC MLF"}]},{"@id":"https://cir.nii.ac.jp/crid/1050861460521112960","@type":"Article","resourceType":"会議発表資料(conference paper)","productIdentifier":[{"@type":"HDL","@value":"http://hdl.handle.net/2433/286343"}],"notation":[{"@language":"en","@value":"Avoiding Soft Error-Induced Illegal Memory Accesses in GPU with Inter-Thread Communication"}]},{"@id":"https://cir.nii.ac.jp/crid/1360861704768009728","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/radecs53308.2021.9954474"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/9954459/9954461/09954474.pdf?arnumber=9954474"}],"notation":[{"@value":"Processor SER Estimation with ACE Bit Analysis"}]},{"@id":"https://cir.nii.ac.jp/crid/1360861705567168384","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/tns.2021.3098845"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/23/9514375/09492031.pdf?arnumber=9492031"}],"notation":[{"@value":"Analyzing DUE Errors on GPUs With Neutron Irradiation Test and Fault Injection to Control Flow"}]},{"@id":"https://cir.nii.ac.jp/crid/1050870529443030912","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"HDL","@value":"http://hdl.handle.net/2433/299776"}],"notation":[{"@language":"en","@value":"Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files"}]},{"@id":"https://cir.nii.ac.jp/crid/1360576118746675200","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/asp-dac47756.2020.9045161"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/9036752/9045099/09045161.pdf?arnumber=9045161"}],"notation":[{"@value":"Soft Error and Its Countermeasures in Terrestrial Environment"}]},{"@id":"https://cir.nii.ac.jp/crid/1010021218958113024","@type":"Article","resourceType":"学術雑誌論文(journal article)","notation":[{"@language":"ja","@value":"Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards"}]},{"@id":"https://cir.nii.ac.jp/crid/1360857593723382144","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/asp-dac47756.2020.9045134"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/9036752/9045099/09045134.pdf?arnumber=9045134"},{"@type":"DOI","@value":"10.48550/arxiv.1909.04697"}],"notation":[{"@value":"When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies"}]},{"@id":"https://cir.nii.ac.jp/crid/1360298755611835008","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/tns.2021.3082559"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/23/9489263/09438674.pdf?arnumber=9438674"}],"notation":[{"@value":"Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization With Neutrons and Alpha Particles"}]},{"@id":"https://cir.nii.ac.jp/crid/1360861704767958144","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/irps45951.2020.9129621"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/9125439/9128217/09129621.pdf?arnumber=9129621"}],"notation":[{"@value":"Characterizing Energetic Dependence of Low-Energy Neutron-induced MCUs in 65 nm bulk SRAMs"}]},{"@id":"https://cir.nii.ac.jp/crid/1360290617633783040","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/tns.2020.2972022"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/23/9142457/08985412.pdf?arnumber=8985412"}],"notation":[{"@value":"Irradiation Test of 65-nm Bulk SRAMs With DC Muon Beam at RCNP-MuSIC Facility"}]},{"@id":"https://cir.nii.ac.jp/crid/1360861704768007552","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/radecs50773.2020.9857684"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/9857595/9857677/09857684.pdf?arnumber=9857684"}],"notation":[{"@value":"Fault Mode Analysis of Neural Network-based Object Detection on GPUs with Neutron Irradiation Test"}]},{"@id":"https://cir.nii.ac.jp/crid/1010580143240346374","@type":"Article","resourceType":"学術雑誌論文(journal article)","notation":[{"@language":"ja","@value":"Development of A Measurement System for Low Energy Cosmic Muon with Charge Identification Feature"}]},{"@id":"https://cir.nii.ac.jp/crid/1360584339756785536","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1109/radecs55911.2022.10412577"},{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/10412245/10412349/10412577.pdf?arnumber=10412577"}],"notation":[{"@value":"Constructing Application-level GPU Error Rate Model with Neutron Irradiation Experiment"}]}],"dataSourceIdentifier":[{"@type":"KAKEN","@value":"19H05664"},{"@type":"IRDB","@value":"oai:irdb.nii.ac.jp:01211:0006217766_KAKEN_8fIWHtT8CVdZi468WCBB9pyeV1w"},{"@type":"IRDB","@value":"oai:irdb.nii.ac.jp:01211:0006786300_KAKEN_8fIWHtT8CVdZi468WCBB9pyeV1w"},{"@type":"IRDB","@value":"oai:irdb.nii.ac.jp:01221:0006845366_JGN_WwYRCWqC8GYQRhS2ieZjNatKeug"},{"@type":"IRDB","@value":"oai:irdb.nii.ac.jp:01221:0005971913_JGN_WwYRCWqC8GYQRhS2ieZjNatKeug"},{"@type":"IRDB","@value":"oai:irdb.nii.ac.jp:01221:0007270407_JGN_WwYRCWqC8GYQRhS2ieZjNatKeug"}],"grant":{"grantIdentifier":[{"@type":"NII","@value":"60"}],"jpcoar:fundingStream":[{"@language":"ja","@value":"基盤研究(S)"},{"@language":"en","@value":"Grant-in-Aid for Scientific Research (S)"}]},"allocationClassification":[{"notation":[{"@language":"ja","@value":"補助金"},{"@language":"en","@value":"Single-year Grants"}]}],"projectStatus":"project_closed","allocationAmount":{"totalCost":{"amount":"203190000","currency":"JPY"},"breakdownCost":[{"notation":[{"@language":"ja","@value":"直接経費"},{"@language":"en","@value":"Direct Cost"}],"amount":"156300000","currency":"JPY"},{"notation":[{"@language":"ja","@value":"間接経費"},{"@language":"en","@value":"Indirect Cost"}],"amount":"46890000","currency":"JPY"}]}}