著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
"YOU, Zhiqiang and IWAGAKI, Tsuyoshi and INOUE, Michiko and FUJIWARA, Hideo",A Low Power Deterministic Test Using Scan Chain Disable Technique,IEICE TRANSACTIONS on Information and Systems,0916-8532,電子情報通信学会,2006-06-01,E89-D,6,1931-1939,https://cir.nii.ac.jp/crid/1050282812513869056,