著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
"温, 暁青 and Yamashita, Yoshiyuki and 梶原, 誠司 and Wang, Laung-Terng and Saluja, Kewal K. and Kinoshita, Kozo",A New Method for Low-Capture-Power Test Generation for Scan Testing,IEICE Transactions on Information and Systems,0916-8532,電子情報通信学会,2006-05-01,E89-D,5,1679-1686,https://cir.nii.ac.jp/crid/1050283687642122880,