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Nanoscale characterization of unintentional doping of atomically thin layered semiconductors by scanning nonlinear dielectric microscopy
Bibliographic Information
- Published
- 2020-08-17
- Resource Type
- journal article
- DOI
-
- 10.1063/5.0016462
- Publisher
- AIP Publishing LLC
Search this article
Description
学術論文(Ariticle)
Journal
-
- Journal of Applied Physics
-
Journal of Applied Physics 128 (7), 074301-, 2020-08-17
AIP Publishing LLC
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Details 詳細情報について
-
- CRID
- 1050289309707354624
-
- NII Article ID
- 120007143328
-
- ISSN
- 00218979
- 10897550
-
- HANDLE
- 10097/00132189
-
- Text Lang
- en
-
- Article Type
- journal article
-
- Data Source
-
- IRDB
- Crossref
- CiNii Articles
- KAKEN
- OpenAIRE
