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Effect of large-angle incidence on particle identification performance for light-charged (Z ≦ 2) particles by pulse shape analysis with a pad-type nTD silicon detector
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- Kawase, Shoichiro
- Department of Advanced Energy Science and Engineering, Kyushu University
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- Murota, Takuya
- Department of Advanced Energy Science and Engineering, Kyushu University
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- Fukuda, Hiroya
- Department of Advanced Energy Science and Engineering, Kyushu University
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- Oishi, Masaya
- Department of Advanced Energy Science and Engineering, Kyushu University
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- Kawata, Teppei
- Department of Advanced Energy Science and Engineering, Kyushu University
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- Kitafuji, Kentaro
- Department of Advanced Energy Science and Engineering, Kyushu University
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- Manabe, Seiya
- Department of Advanced Energy Science and Engineering, Kyushu University
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- Watanabe, Yukinobu
- Department of Advanced Energy Science and Engineering, Kyushu University
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- Nishibata, Hiroki
- Department of Physics, Kyushu University
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- Go, Shintaro
- Department of Physics, Kyushu University
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- Kai, Tamito
- Department of Physics, Kyushu University
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- Muto, Taiga
- Department of Physics, Kyushu University
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- Matsuzaki, Teiichiro
- Nishina Center, RIKEN
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- Ishida, Katsuhiko
- Nishina Center, RIKEN Muon Science Laboratory
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- Suzuki, Daisuke
- Nishina Center, RIKEN
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- Ishibashi, Yuichi
- Department of Physics, Kyushu University
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- Kitamura, Noritaka
- Center for Nuclear Study, the University of Tokyo
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- Niikura, Megumi
- Nishina Center, RIKEN Department of Physics, the University of Tokyo
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- Nagata, Yuto
- Department of Physics, Kyushu University
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- Mizuno, Rurie
- Department of Physics, the University of Tokyo
Bibliographic Information
- Other Title
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- Effect of large-angle incidence on particle identification performance for light-charged (<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si2.svg" display="inline" id="d1e252"><mml:mrow><mml:mi>Z</mml:mi><mml:mo linebreak="goodbreak" linebreakstyle="after">≤</mml:mo><mml:mn>2</mml:mn></mml:mrow></mml:math>) particles by pulse shape analysis with a pad-type nTD silicon detector
- Published
- 2024-02
- Resource Type
- journal article
- DOI
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- 10.1016/j.nima.2023.168984
- Publisher
- Elsevier
Search this article
Description
In recent years, particle discrimination methods based on digital waveform analysis techniques for neutron-transmutation-doped silicon (nTD-Si) detectors have become widely used for the identification of low-energy charged particles. Although the particle discrimination capability of this method has been well demonstrated for small incident angles, the particle discrimination performance may be affected by changes in the detector response when the detector is moved closer to the charged particle source and the incident position distribution and incident angle distribution to the detector become wide. In this study, we performed a beam test for particle discrimination in light-charged (Z ≦ 2) particles using the digital waveform analysis method with a pad-type nTD-Si detector and investigated the dependence of the performance of the particle discrimination on the incident position and incident angle. As the incident angle increased, a decrease in the maximum current was observed, which was sufficient to affect the performance of the particle discrimination. This decrease can be expressed as a function of the penetration depth of the charged particles into the detector, which varies for each nuclide.
Journal
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- Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 1059 168984-, 2024-02
Elsevier
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Details 詳細情報について
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- CRID
- 1050306495455783040
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- NII Book ID
- AA10529991
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- ISSN
- 24688967
- 01689002
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- HANDLE
- 2324/7174411
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- Text Lang
- en
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- Article Type
- journal article
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- Data Source
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- IRDB
- Crossref
- KAKEN
- OpenAIRE
