Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
"Yamamoto, Hidekazu and Shiratori, Miho",Evaluation of Stacking Faults in SiC Crystal by Transmission Election Microscope,Report of Chiba Institute of Technology,,Chiba Institute of Technology,2016-01-01,63,,23-28,https://cir.nii.ac.jp/crid/1050845762945760640,