Evaluation of Stacking Faults in SiC Crystal by Transmission Election Microscope
Bibliographic Information
- Other Title
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- SiC 結晶中の積層欠陥の透過電子顕微鏡による構造解析
Journal
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- Report of Chiba Institute of Technology
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Report of Chiba Institute of Technology 63 23-28, 2016-01-01
Chiba Institute of Technology
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Keywords
Details 詳細情報について
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- CRID
- 1050845762945760640
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- Text Lang
- ja
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- Article Type
- departmental bulletin paper
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- Data Source
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- IRDB