X-Ray-Fluorescence Spectroscopy of Cu-In-Se Chalcopyrite-Structure Thin-Films

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Bibliographic Information

Published
1992-09-15
Resource Type
journal article
Rights Information
  • Copyright © 1992 American Physical Society
DOI
  • 10.1103/physrevb.46.7911
Publisher
Published for the American Physical Society by the American Institute of Physics

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Description

In x-ray fluorescence spectroscopy we have observed a positive shift of the Cu L(alpha) x-ray energy with an increase of the number of excess electrons in the electron-doped Cu-In-Se chalcopyrite-structure thin films. This positive shift can be reproduced well by the energy calculation using the Hartree-Fock-Slater method by taking into account the Cu 4s-3d rehybridization effect. We discovered that the excess electrons entered into the lower conduction band dominated by the Cu 4s orbital in the n-type Cu-In-Se thin films deposited by a molecular-beam method.

Journal

  • Physical review B. Condensed matter

    Physical review B. Condensed matter 46 (12), 7911-7914, 1992-09-15

    Published for the American Physical Society by the American Institute of Physics

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