Ultrafast nonlinear optical responses of bismuth doped silicon-rich　silica films

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Bibliographic Information

Published
2012-11
Resource Type
journal article
DOI
  • 10.1063/1.4766269
Publisher
American Institute of Physics (AIP)

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Description

Nonlinear optical responses of bismuth (Bi) doped silicon-rich silicon dioxide (Si-rich SiO2) films were studied by a z-scan and an optical Kerr gate method under femtosecond excitation around 800 nm. It was found that the Bi-doping enhances the nonlinear optical response of Si-rich SiO2 films by several orders of magnitudes. The nonlinear refractive index was of the order of 10−11 cm2/W and the response time was shorter than our time resolution of 100 fs. The nonlinear refractive index was independent of the wavelength in the range from 750 to 835 nm, suggesting that virtual transitions are involved in the nonlinear optical processes.

Journal

  • Applied Physics Letters

    Applied Physics Letters 101 (19), 191106-191106, 2012-11

    American Institute of Physics (AIP)

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