著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
"Ye, Qing and 井上, 光平 and 原, 健二",Image Size-Preserving Visual Cryptography by Error Diffusion,Journal of the Institute of Industrial Applications Engineers,2188-1758,Institute of Industrial Applications engineers( IIAE ),2023-07-25,11,3,50-54,https://cir.nii.ac.jp/crid/1050862931498657152,