{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1070586344597308672.json","@type":"Researcher","foaf:Person":[{"foaf:name":[{"@language":"en","@value":"Kuwabara, Nobuo"},{"@language":"ja","@value":"桑原, 伸夫"},{"@language":"ja-Kana","@value":"クワバラ, ノブオ"}]}],"career":[{"institution":{"notation":[{"@language":"ja","@value":"NTT通信網総合研究所"},{"@language":"en","@value":"NTT Telecommunication Networks Laboratories"}]}}],"product":[{"@id":"https://cir.nii.ac.jp/crid/1050289920561237504","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"HDL","@value":"http://hdl.handle.net/10228/00008496"},{"@type":"URI","@value":"https://kyutech.repo.nii.ac.jp/records/7292"},{"@type":"NDL_BIB_ID","@value":"3783349"},{"@type":"NDL_CALL_NUMBER","@value":"Z16-1851"},{"@type":"URI","@value":"http://id.ndl.go.jp/bib/3783349"},{"@type":"URI","@value":"https://ndlsearch.ndl.go.jp/books/R000000004-I3783349"},{"@type":"NAID","@value":"10006929961"},{"@type":"NAID","@value":"80006034799"}],"notation":[{"@language":"ja","@value":"間接ESDに伴う電磁パルスの測定と解析"},{"@language":"en","@value":"Measurement and Analysis of Electromagnetic Pulses due to Indirect ESD"},{"@language":"ja-Kana","@value":"カンセツ ESD ニ トモナウ デンジ パルス ノ ソクテイ ト カイセキ"}],"relation":[{"type":"creator"}]}],"dataSourceIdentifier":[{"@type":"IRDB","@value":"oai:irdb.nii.ac.jp:01216:0005161099_ZLiMDQwN1PHJzxb11qgch2NkIaJ"},{"@type":"CIA","@value":"10006929961_PWRs9tw8AOCVAlLRIPWCtDMdlYo"}]}