著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"International Conference on Defects in Semiconductors and Suezawa, Masashi and Katayama-Yoshida, Hiroshi","Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995",,Trans Tech Publications,1995,Materials science forum,,"0878497161,0878497129,0878497137,0878497145,0878497153",,https://cir.nii.ac.jp/crid/1130000793786798720