著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Lloyd, J. R. (James R.) and Yost, Frederick G. and Ho, P. S. and Materials Research Society and MRS Symposium on Materials Reliability Issues in Microelectronics","Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.",,Materials Research Society,1991,Materials Research Society symposium proceedings,,1558991190,,https://cir.nii.ac.jp/crid/1130000793822837760