著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL "早稲田, 嘉夫",Anomalous X-ray scattering for materials characterization : atomic-scale structure determination,,Springer,2002,Physics and astronomy online library,,9783540434436,,https://cir.nii.ac.jp/crid/1130000793917264896