著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Snyder, R. L. (Robert L.) and Fiala, Jaroslav and Bunge, H.-J. (Hans Joachim)",Defect and microstructure analysis by diffraction,,Oxford University Press,1999,International Union of Crystallography monographs on crystallography,,0198501897,,https://cir.nii.ac.jp/crid/1130000794156423168