著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Breitenstein, O. (Otwin) and Warta, W. (Wilhelm) and Schubert, Martin C.",Lock-in thermography : basics and use for evaluating electronic devices and materials,3rd ed,Springer Nature Switzerland,2018,Advanced microelectronics,,9783319998244,,https://cir.nii.ac.jp/crid/1130000794407011456