著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Adams, R. Dean","High performance memory testing : design principles, fault modeling, and self-test",,Kluwer Academic,2003,Frontiers in electronic testing,,1402072554,,https://cir.nii.ac.jp/crid/1130000794482302976