著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Pavlov, Andrei and Sachdev, Manoj",CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test,,Springer,2008,Frontiers in electronic testing,,9781402083624,,https://cir.nii.ac.jp/crid/1130000794487965184