著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Nicolici, Nicola and Al-Hashimi, Bashir",Power-constrained testing of VLSI circuits,,Kluwer Academic,2003,Frontiers in electronic testing,,140207235X,,https://cir.nii.ac.jp/crid/1130000794538421248