著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Thompson, C. V. (Carl V.) and Lloyd, J. R. (James R.)","Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.",,Materials Research Society,1992,Materials Research Society symposium proceedings,,1558991603,,https://cir.nii.ac.jp/crid/1130000794704890368