著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"International Conference on Defects, Recognition, Imaging and Physics in Semiconductors and 小川, 智哉 and 田島, 道夫","Defects, recognition, imaging and physics in semiconductors, 1999 : proceedings of the eighth International Conference on Defects, Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999",,North-Holland : Elsevier,2000,Journal of crystal growth,,,,https://cir.nii.ac.jp/crid/1130000794825224064