Author,Title,Edition,Publisher,Year,Series,Number,ISBN,ISSN,URL
"酒井, 明 and Pickering, H. W. and 桜井, 敏雄",Atom-probe field ion microscopy and its applications,,Academic Press,1989,Advances in electronics and electron physics : supplement,,0120145820,,https://cir.nii.ac.jp/crid/1130000794982182400