著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods and Tanner, B. K. (Brian Keith) and Bowen, D. Keith (David Keith)","Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]",,Plenum Press,1980,NATO advanced study institutes series,,0306406284,,https://cir.nii.ac.jp/crid/1130000795054485376