著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Tobin, Kenneth W. and IS & T--the Society for Imaging Science and Technology and Society of Photo-optical Instrumentation Engineers","Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California",,SPIE,2000,Proceedings,,0819435848,,https://cir.nii.ac.jp/crid/1130000795244056960