著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Khare, Jitendra B. and Maly, W.","From contamination to defects, faults, and yield loss : simulation and applications",,Kluwer Academic Publishers,1996,Frontiers in electronic testing,,0792397142,,https://cir.nii.ac.jp/crid/1130000795393815040