著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Society of Photo-optical Instrumentation Engineers and Chen, Philip T. C. and Uy, O. Manuel","Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA",,SPIE,2002,Proceedings,,081944541X,,https://cir.nii.ac.jp/crid/1130000795455753728