著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Knight, Larry V. and Bowen, D. Keith (David Keith) and University of Rochester. Institute of Optics and Society of Photo-optical Instrumentation Engineers","X-ray imaging II : 21-22 August 1986, San Diego, California",,SPIE--the International Society for Optical Engineering,1986,Proceedings,,0892527269,,https://cir.nii.ac.jp/crid/1130000795490665984