著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Dawson, Benjamin M. and Wilson, Stephen S. and Wu, Frederick Y. and IS&T--the Society for Imaging Science and Technology and Society of Photo-optical Instrumentation Engineers","Machine vision applications in industrial inspection II : 8-9 February 1994, San Jose, California",,SPIE,1994,Proceedings,,0819414786,,https://cir.nii.ac.jp/crid/1130000795997953536