著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Aspnes, D. E. and Speyer, J. S. (Jacob Samuel) and Potter, Roy F.","Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California",,S.P.I.E.-- Society of Photo-optical Instrumentation Engineers,1981,Proceedings of the Society of Photo-Optical Instrumentation Engineers,,0892523093,,https://cir.nii.ac.jp/crid/1130000796125497216