著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Baker, L. R. (Lionel R.) and Bennett, Harold Earl and Sira Limited","Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California",,SPIE--the International Society for Optical Engineering,1985,Proceedings,,0892525606,,https://cir.nii.ac.jp/crid/1130000796260069504