著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Breitenstein, O. (...Otwin...) and Langenkamp, M. (...Martin...)",Lock-in thermography : basics and use for functional diagnostics of electronic components,,Springer,2003,Advanced microelectronics,,3540434399,,https://cir.nii.ac.jp/crid/1130000796409262592