著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Greivenkamp, John E. and Young, Matt and Society of Photo-optical Instrumentation Engineers","Surface characterization and testing II : 10-11 August 1989, San Diego, California",,SPIE--the International Society for Optical Engineering,1989,Proceedings,,0819402001,,https://cir.nii.ac.jp/crid/1130000796561449728