著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Rein, S. (Stefan)",Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications,,Springer,2005,Springer series in materials science,,3540253033,,https://cir.nii.ac.jp/crid/1130000796565937664