著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Stover, John C. and Society of Photo-optical Instrumentation Engineers","Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California",,Sponsored and published by SPIE-The International Society for Optical Engineering,1998,Proceedings,,0819427144,,https://cir.nii.ac.jp/crid/1130000796595343104